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ELECTRONICS
































        Figure 3: 2 x SPDT switch with extended protection.

        The IC features internal positive overvoltage and surge protection.   Figure 5: D+/D- eye diagram
        The device handles USB low/full/high-speed signaling and
        operates from a 2.7V to 5.5V supply. The IC is available in a   Data Integrity
        12-bump (1.23mm x 1.63mm) wafer-level package (WLP) and   The eye diagram in Figure 5 shows at a glance the good level
        operates over the -40°C to +85°C extended temperature range.  of integrity of the data signal, as the curved blue lines maintain
                                                               close-to-maximum distance from the forbidden red zone. The high
        Extended Protection                                    bandwidth of the protection IC causes minimum slowdown of the
        ESD protection structures are incorporated on all pins to protect   signal rise and fall times and jitter, resulting in a good margin for
        against electrostatic discharges up to ±2kV (Human Body Model)   error, important to pass USB compliance tests.
        encountered during handling and assembly. COMA and COMB
        (Figures 2 and 3) are further protected against ESD up to ±15kV   Conclusion
        (Human Body Model), ±15kV (Air Gap Discharge method described   With USB Type-C come new challenges in interconnecting,
        in IEC 61000-4-2), and ±8kV (Contact Discharge method described   powering, and protecting our electronic gadgets such as digital
        in IEC61000-4-2) without damage. The ESD structures withstand   cameras and ultra-thin tablets. The new connector has a smaller
        high ESD, both in normal operation and when the device is   pitch than that of the USB Micro-B, leading to increased risk of
        powered down. After an ESD event, the IC continues to function   mechanical shorts to VBUS. Additionally, due to the high voltages
        without latch-up. The IC is surge-protected from -30V to +45V   associated with USB PD, more robust protections are needed.
        (IEC61000-4-5) and overvoltage protected up to +20.5V.  And finally, the ever increasing complexity of the electronic loads
           Figure 4 compares the PCB layout of this highly integrated,   demands enhanced protection from ESD and voltage surges. In this
        extended protection solution, with a typical competitor device   design solution, we showed that an enhanced protection device
        offering positive-only surge protection and lower OV and ESD   with up to ±15kV ESD protection, -30V to +45V surge protection
        protections. The latter will require additional circuitry to meet   and +20.5V overvoltage protection can singlehandedly protect the
        ESD/Surge/OV specifications, leading to a more costly BOM and a   data lines and, compared to less integrated devices, meet ESD/
        5X bigger PCB active area occupancy.                   Surge/OV specifications with a lower BOM and smaller PCB active
                                                               area occupancy.                                  n

                                                                About the authors
                                                                 Nazzareno (Reno) Rossetti is an Analog and Power
                                                                Management expert at Maxim Integrated. He is a published
                                                                author with several patents in this field. Reno holds a doctorate
                                                                in Electrical Engineering from Politecnico di Torino, Italy.
                                                                   Josh Fankhauser is a Business Manager at Maxim Integrated
                                                                in the Industrial and Healthcare business unit working on
                                                                industrial communication solutions. Josh holds a master’s
                                                                degree in Materials Science and Engineering from the
                                                                University of California-Los Angeles. Thanks to Bob Kelly for his
                                                                help on Figure 5.
        Figure 4: Extended protection advantage.



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